# Few-Shot Defect Segmentation Leveraging Abundant Defect-Free Training Samples Through Normal Background Regularization And Crop-And-Paste Operation

> Research article (2021 IEEE International Conference on Multimedia and Expo (ICME), 2021) · cited 27× · AI/ML

**Wikidata**: [openalex:W3170790383](https://www.wikidata.org/wiki/openalex:W3170790383)  
**Source**: https://4ort.xyz/entity/few-shot-defect-segmentation-leveraging-abundant-defect-free-training-samples-through-normal-background-regularization-a