# Few-shot defect detection using feature enhancement and image generation for manufacturing quality inspection

> Research article (Applied Intelligence, 2023) · cited 19× · AI/ML

**Wikidata**: [openalex:W4389612410](https://www.wikidata.org/wiki/openalex:W4389612410)  
**Source**: https://4ort.xyz/entity/few-shot-defect-detection-using-feature-enhancement-and-image-generation-for-manufacturing-quality-inspection