# Feature-Metric Registration: A Fast Semi-Supervised Approach for Robust Point Cloud Registration Without Correspondences

> Research article (2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2020) · cited 307× · AI/ML

**Wikidata**: [openalex:W3034295752](https://www.wikidata.org/wiki/openalex:W3034295752)  
**Source**: https://4ort.xyz/entity/feature-metric-registration-a-fast-semi-supervised-approach-for-robust-point-cloud-registration-without-correspondences