# Feature Concentration for Supervised and Semisupervised Learning With Unbalanced Datasets in Visual Inspection

> Research article (IEEE Transactions on Industrial Electronics, 2020) · cited 14× · AI/ML

**Wikidata**: [openalex:W3037606055](https://www.wikidata.org/wiki/openalex:W3037606055)  
**Source**: https://4ort.xyz/entity/feature-concentration-for-supervised-and-semisupervised-learning-with-unbalanced-datasets-in-visual-inspection