# Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits

> Research article (2015 IEEE 24th Asian Test Symposium (ATS), 2015) · cited 10× · AI/ML

**Wikidata**: [openalex:W2296069189](https://www.wikidata.org/wiki/openalex:W2296069189)  
**Source**: https://4ort.xyz/entity/fault-simulation-and-test-pattern-generation-for-cross-gate-defects-in-finfet-circuits