# Fault detection for semiconductor quality control based on Spark using data mining technology

> Research article (2018 Chinese Control And Decision Conference (CCDC), 2018) · cited 11× · AI/ML

**Wikidata**: [openalex:W2882845160](https://www.wikidata.org/wiki/openalex:W2882845160)  
**Source**: https://4ort.xyz/entity/fault-detection-for-semiconductor-quality-control-based-on-spark-using-data-mining-technology