# FastRecon: Few-shot Industrial Anomaly Detection via Fast Feature Reconstruction

> Research article (2023 IEEE/CVF International Conference on Computer Vision (ICCV), 2023) · cited 73× · AI/ML

**Wikidata**: [openalex:W4390872785](https://www.wikidata.org/wiki/openalex:W4390872785)  
**Source**: https://4ort.xyz/entity/fastrecon-few-shot-industrial-anomaly-detection-via-fast-feature-reconstruction