# Fast Defect Inspection Based on Data-Driven Photometric Stereo

> Research article (IEEE Transactions on Instrumentation and Measurement, 2018) · cited 38× · AI/ML

**Wikidata**: [openalex:W2887975641](https://www.wikidata.org/wiki/openalex:W2887975641)  
**Source**: https://4ort.xyz/entity/fast-defect-inspection-based-on-data-driven-photometric-stereo