# Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy

> Research article (Nanomaterials, 2020) · cited 10× · AI/ML

**Wikidata**: [openalex:W3012326895](https://www.wikidata.org/wiki/openalex:W3012326895)  
**Source**: https://4ort.xyz/entity/facile-and-reliable-thickness-identification-of-atomically-thin-dichalcogenide-semiconductors-using-hyperspectral-micros