# Exploring the Impact of Random Telegraph Noise-Induced Accuracy Loss on Resistive RAM-Based Deep Neural Network

> Research article (IEEE Transactions on Electron Devices, 2020) · cited 23× · AI/ML

**Wikidata**: [openalex:W3034602727](https://www.wikidata.org/wiki/openalex:W3034602727)  
**Source**: https://4ort.xyz/entity/exploring-the-impact-of-random-telegraph-noise-induced-accuracy-loss-on-resistive-ram-based-deep-neural-network