# Exploring Active Learning for Semiconductor Defect Segmentation

> Research article (2022 IEEE International Conference on Image Processing (ICIP), 2022) · cited 12× · AI/ML

**Wikidata**: [openalex:W4308236022](https://www.wikidata.org/wiki/openalex:W4308236022)  
**Source**: https://4ort.xyz/entity/exploring-active-learning-for-semiconductor-defect-segmentation