# Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors

> Research article (Nanoscale Advances, 2022) · cited 11× · AI/ML

**Wikidata**: [openalex:W4221117917](https://www.wikidata.org/wiki/openalex:W4221117917)  
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