# Experimental characterization of the static noise margins of strained silicon complementary tunnel-FET SRAM

> Research article (2017 47th European Solid-State Device Research Conference (ESSDERC), 2017) · cited 10× · AI/ML

**Wikidata**: [openalex:W2761581502](https://www.wikidata.org/wiki/openalex:W2761581502)  
**Source**: https://4ort.xyz/entity/experimental-characterization-of-the-static-noise-margins-of-strained-silicon-complementary-tunnel-fet-sram