# Experimental and theoretical verification of channel conductivity degradation due to grain boundaries and defects in 3D NAND

> Research article (2017 IEEE International Electron Devices Meeting (IEDM), 2017) · cited 20× · AI/ML

**Wikidata**: [openalex:W2787833261](https://www.wikidata.org/wiki/openalex:W2787833261)  
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