# Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS

> Research article (2021 IEEE International Electron Devices Meeting (IEDM), 2021) · cited 26× · AI/ML

**Wikidata**: [openalex:W4225540121](https://www.wikidata.org/wiki/openalex:W4225540121)  
**Source**: https://4ort.xyz/entity/evidence-of-tunneling-driven-random-telegraph-noise-in-cryo-cmos