# Evidence of Filamentary Switching in Oxide-based Memory Devices via Weak Programming and Retention Failure Analysis

> Research article (Scientific Reports, 2015) · cited 47× · AI/ML

**Wikidata**: [openalex:W1251868664](https://www.wikidata.org/wiki/openalex:W1251868664)  
**Source**: https://4ort.xyz/entity/evidence-of-filamentary-switching-in-oxide-based-memory-devices-via-weak-programming-and-retention-failure-analysis