# Enhancing the metrological performance of non-raster scanning probe microscopy using Gaussian process regression

> Research article (Measurement Science and Technology, 2019) · cited 12× · AI/ML

**Wikidata**: [openalex:W2942287057](https://www.wikidata.org/wiki/openalex:W2942287057)  
**Source**: https://4ort.xyz/entity/enhancing-the-metrological-performance-of-non-raster-scanning-probe-microscopy-using-gaussian-process-regression