# Engineering Breakdown Probability Profile for PDP and DCR Optimization in a SPAD Fabricated in a Standard 55 nm BCD Process

> Research article (IEEE Journal of Selected Topics in Quantum Electronics, 2021) · cited 43× · AI/ML

**Wikidata**: [openalex:W3198990222](https://www.wikidata.org/wiki/openalex:W3198990222)  
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