# Endurance improvements and defect characterization in ferroelectric FETs through interface fluorination

> Research article (2022 IEEE International Memory Workshop (IMW), 2022) · cited 30× · AI/ML

**Wikidata**: [openalex:W4281572070](https://www.wikidata.org/wiki/openalex:W4281572070)  
**Source**: https://4ort.xyz/entity/endurance-improvements-and-defect-characterization-in-ferroelectric-fets-through-interface-fluorination