# EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan

> Research article (Quality and Reliability Engineering International, 2021) · cited 23× · AI/ML

**Wikidata**: [openalex:W3214156277](https://www.wikidata.org/wiki/openalex:W3214156277)  
**Source**: https://4ort.xyz/entity/embased-likelihood-inference-for-oneshot-device-test-data-under-lognormal-lifetimes-and-the-optimal-design-of-a-csalt-pl