# Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation

> Research article (Solid-State Electronics, 2015) · cited 24× · AI/ML

**Wikidata**: [openalex:W2203213742](https://www.wikidata.org/wiki/openalex:W2203213742)  
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