# Efficient Parametric Yield Estimation Over Multiple Process Corners via Bayesian Inference Based on Bernoulli Distribution

> Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2019) · cited 11× · AI/ML

**Wikidata**: [openalex:W2972619754](https://www.wikidata.org/wiki/openalex:W2972619754)  
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