# Efficient Mixed-Type Wafer Defect Pattern Recognition Based on Light-Weight Neural Network

> Research article (Micromachines, 2024) · cited 14× · AI/ML

**Wikidata**: [openalex:W4400130022](https://www.wikidata.org/wiki/openalex:W4400130022)  
**Source**: https://4ort.xyz/entity/efficient-mixed-type-wafer-defect-pattern-recognition-based-on-light-weight-neural-network