# Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation

> Research article (2016 IEEE 25th Asian Test Symposium (ATS), 2016) · cited 10× · AI/ML

**Wikidata**: [openalex:W2564408197](https://www.wikidata.org/wiki/openalex:W2564408197)  
**Source**: https://4ort.xyz/entity/efficient-cell-aware-fault-modeling-by-switch-level-test-generation