# Effects of Spacer and Single-Charge Trap on Voltage Transfer Characteristics of Gate-All-Around Silicon Nanowire CMOS Devices and Circuits

> Research article (2020 IEEE 20th International Conference on Nanotechnology (IEEE-NANO), 2020) · cited 25× · AI/ML

**Wikidata**: [openalex:W3081838769](https://www.wikidata.org/wiki/openalex:W3081838769)  
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