# Effects of Negative-Bias-Temperature-Instability on Low-Frequency Noise in SiGe ${p}$ MOSFETs

> Research article (IEEE Transactions on Device and Materials Reliability, 2016) · cited 18× · AI/ML

**Wikidata**: [openalex:W2522717505](https://www.wikidata.org/wiki/openalex:W2522717505)  
**Source**: https://4ort.xyz/entity/effects-of-negative-bias-temperature-instability-on-low-frequency-noise-in-sige-p-mosfets