# Effects of Interface Traps and Hydrogen on the Low-Frequency Noise of Irradiated MOS Devices

> Research article (IEEE Transactions on Nuclear Science, 2023) · cited 15× · AI/ML

**Wikidata**: [openalex:W4387491066](https://www.wikidata.org/wiki/openalex:W4387491066)  
**Source**: https://4ort.xyz/entity/effects-of-interface-traps-and-hydrogen-on-the-low-frequency-noise-of-irradiated-mos-devices