# Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs

> Research article (IEEE Journal of the Electron Devices Society, 2018) · cited 18× · AI/ML

**Wikidata**: [openalex:W2820381790](https://www.wikidata.org/wiki/openalex:W2820381790)  
**Source**: https://4ort.xyz/entity/effects-of-fluorine-on-the-nbti-reliability-and-low-frequency-noise-characteristics-of-p-mosfets