# Effective Tilting Angles for a Dual Probes AFM System to Achieve High-Precision Scanning

> Research article (IEEE/ASME Transactions on Mechatronics, 2016) · cited 26× · AI/ML

**Wikidata**: [openalex:W2416963117](https://www.wikidata.org/wiki/openalex:W2416963117)  
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