# Effective DC fault models and testing approach for open defects in analog circuits

> Research article (2016 IEEE International Test Conference (ITC), 2016) · cited 23× · AI/ML

**Wikidata**: [openalex:W2567975304](https://www.wikidata.org/wiki/openalex:W2567975304)  
**Source**: https://4ort.xyz/entity/effective-dc-fault-models-and-testing-approach-for-open-defects-in-analog-circuits