# Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel

> Research article (Journal of Intelligent Manufacturing, 2019) · cited 54× · AI/ML

**Wikidata**: [openalex:W2982535616](https://www.wikidata.org/wiki/openalex:W2982535616)  
**Source**: https://4ort.xyz/entity/effective-automatic-defect-classification-process-based-on-cnn-with-stacking-ensemble-model-for-tft-lcd-panel