# Effect of Irrelevant Variables on Faulty Wafer Detection in Semiconductor Manufacturing

> Research article (Energies, 2019) · cited 15× · AI/ML

**Wikidata**: [openalex:W2954466630](https://www.wikidata.org/wiki/openalex:W2954466630)  
**Source**: https://4ort.xyz/entity/effect-of-irrelevant-variables-on-faulty-wafer-detection-in-semiconductor-manufacturing