# Edge Detection in Scanning Electron Microscope (SEM) Images using Various Algorithms

> Research article (2020 4th International Conference on Intelligent Computing and Control Systems (ICICCS), 2020) · cited 21× · AI/ML

**Wikidata**: [openalex:W3035835860](https://www.wikidata.org/wiki/openalex:W3035835860)  
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