# Dynamic V<sub>TH</sub> Tracking for Cross-Temperature Suppression in 3D-TLC NAND Flash

> Research article (2019 IEEE International Integrated Reliability Workshop (IIRW), 2019) · cited 15× · AI/ML

**Wikidata**: [openalex:W3005827677](https://www.wikidata.org/wiki/openalex:W3005827677)  
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