# Drain-Current Flicker Noise Modeling in nMOSFETs From a 14-nm FDSOI Technology

> Research article (IEEE Transactions on Electron Devices, 2015) · cited 27× · AI/ML

**Wikidata**: [openalex:W2057001139](https://www.wikidata.org/wiki/openalex:W2057001139)  
**Source**: https://4ort.xyz/entity/drain-current-flicker-noise-modeling-in-nmosfets-from-a-14-nm-fdsoi-technology