# Disturbance-free BIST for loop characterization of DC-DC buck converters

> Research article (2015 IEEE 33rd VLSI Test Symposium (VTS), 2015) · cited 10× · AI/ML

**Wikidata**: [openalex:W1601946176](https://www.wikidata.org/wiki/openalex:W1601946176)  
**Source**: https://4ort.xyz/entity/disturbance-free-bist-for-loop-characterization-of-dc-dc-buck-converters