# Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels

> Research article (Journal of Intelligent Manufacturing, 2020) · cited 40× · AI/ML

**Wikidata**: [openalex:W3016981641](https://www.wikidata.org/wiki/openalex:W3016981641)  
**Source**: https://4ort.xyz/entity/discriminative-feature-learning-and-cluster-based-defect-label-reconstruction-for-reducing-uncertainty-in-wafer-bin-map-