# Device Instability of ReRAM and a Novel Reference Cell Design for Wide Temperature Range Operation

> Research article (IEEE Electron Device Letters, 2017) · cited 10× · AI/ML

**Wikidata**: [openalex:W2739592010](https://www.wikidata.org/wiki/openalex:W2739592010)  
**Source**: https://4ort.xyz/entity/device-instability-of-reram-and-a-novel-reference-cell-design-for-wide-temperature-range-operation