# Development of Frequency-Mixed Point-Focusing Shear Horizontal Guided-Wave EMAT for Defect Inspection Using Deep Neural Network

> Research article (IEEE Transactions on Instrumentation and Measurement, 2020) · cited 45× · AI/ML

**Wikidata**: [openalex:W3095866651](https://www.wikidata.org/wiki/openalex:W3095866651)  
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