# Detection of Defects in Printed Circuit Boards by Clustering the Etalon and Defected Samples

> Research article (2020 IEEE 15th International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET), 2020) · cited 15× · AI/ML

**Wikidata**: [openalex:W3022021043](https://www.wikidata.org/wiki/openalex:W3022021043)  
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