# Detection and clustering of mixed-type defect patterns in wafer bin maps

> Research article (IISE Transactions, 2017) · cited 90× · AI/ML

**Wikidata**: [openalex:W2764262416](https://www.wikidata.org/wiki/openalex:W2764262416)  
**Source**: https://4ort.xyz/entity/detection-and-clustering-of-mixed-type-defect-patterns-in-wafer-bin-maps