# Detection and Classification of Defects Using ECT and Multi-Level SVM Model

> Research article (IEEE Sensors Journal, 2019) · cited 39× · AI/ML

**Wikidata**: [openalex:W2984852017](https://www.wikidata.org/wiki/openalex:W2984852017)  
**Source**: https://4ort.xyz/entity/detection-and-classification-of-defects-using-ect-and-multi-level-svm-model