# Detecting and Measuring Defects in Wafer Die Using GAN and YOLOv3

> Research article (Applied Sciences, 2020) · cited 37× · AI/ML

**Wikidata**: [openalex:W3111544438](https://www.wikidata.org/wiki/openalex:W3111544438)  
**Source**: https://4ort.xyz/entity/detecting-and-measuring-defects-in-wafer-die-using-gan-and-yolov3