# Detailed characterisation of Si Gate-All-Around Nanowire MOSFETs at cryogenic temperatures

> Research article (Solid-State Electronics, 2018) · cited 22× · AI/ML

**Wikidata**: [openalex:W2793412827](https://www.wikidata.org/wiki/openalex:W2793412827)  
**Source**: https://4ort.xyz/entity/detailed-characterisation-of-si-gate-all-around-nanowire-mosfets-at-cryogenic-temperatures