# Depth Resolution Dependence on Sample Thickness and Incident Energy in On-Axis Transmission Kikuchi Diffraction in Scanning Electron Microscope (SEM)

> Research article (Microscopy and Microanalysis, 2017) · cited 14× · AI/ML

**Wikidata**: [openalex:W2780857112](https://www.wikidata.org/wiki/openalex:W2780857112)  
**Source**: https://4ort.xyz/entity/depth-resolution-dependence-on-sample-thickness-and-incident-energy-in-on-axis-transmission-kikuchi-diffraction-in-scann