# Degradation Behavior and Defect Analysis for SiC Power MOSFETs Based on Low-Frequency Noise Under Repetitive Power-Cycling Stress

> Research article (IEEE Transactions on Electron Devices, 2020) · cited 22× · AI/ML

**Wikidata**: [openalex:W3115890916](https://www.wikidata.org/wiki/openalex:W3115890916)  
**Source**: https://4ort.xyz/entity/degradation-behavior-and-defect-analysis-for-sic-power-mosfets-based-on-low-frequency-noise-under-repetitive-power-cycli