# Defects and Low-Frequency Noise in Irradiated Black Phosphorus MOSFETs With HfO<sub>2</sub>Gate Dielectrics

> Research article (IEEE Transactions on Nuclear Science, 2018) · cited 46× · AI/ML

**Wikidata**: [openalex:W2801708701](https://www.wikidata.org/wiki/openalex:W2801708701)  
**Source**: https://4ort.xyz/entity/defects-and-low-frequency-noise-in-irradiated-black-phosphorus-mosfets-with-hfo-sub-2-sub-gate-dielectrics