# Defect inspection of solder bumps using the scanning acoustic microscopy and fuzzy SVM algorithm

> Research article (Microelectronics Reliability, 2016) · cited 34× · AI/ML

**Wikidata**: [openalex:W2511487792](https://www.wikidata.org/wiki/openalex:W2511487792)  
**Source**: https://4ort.xyz/entity/defect-inspection-of-solder-bumps-using-the-scanning-acoustic-microscopy-and-fuzzy-svm-algorithm