# Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect Inspection

> Research article (2021 IEEE Winter Conference on Applications of Computer Vision (WACV), 2021) · cited 159× · AI/ML

**Wikidata**: [openalex:W3120387510](https://www.wikidata.org/wiki/openalex:W3120387510)  
**Source**: https://4ort.xyz/entity/defect-gan-high-fidelity-defect-synthesis-for-automated-defect-inspection