# Defect detection and classification on semiconductor wafers using two-stage geometric transformation-based data augmentation and SqueezeNet lightweight convolutional neural network

> Research article (Computers & Industrial Engineering, 2023) · cited 39× · AI/ML

**Wikidata**: [openalex:W4386012776](https://www.wikidata.org/wiki/openalex:W4386012776)  
**Source**: https://4ort.xyz/entity/defect-detection-and-classification-on-semiconductor-wafers-using-two-stage-geometric-transformation-based-data-augmenta